The National Instruments part number 783638-01 corresponds to the PXIe-6591, a high-speed serial instrument designed for rigorous verification and testing of serial protocols. This device is equipped with 2 GB of single-bank memory, enabling it to efficiently handle demanding applications. At its core, the PXIe-6591 features a reconfigurable Xilinx Kintex-7 FPGA, which affords users the flexibility to customize functionalities tailored to specific application requirements, achieving a theoretical maximum data rate of 10.5 GB/s. The instrument is programmable using NI’s LabVIEW FPGA Module, further enhancing its adaptability.

The front panel of the PXIe-6591 is outfitted with a variety of connectors, including two mini-SAS HD connectors (Port 0 and Port 1) each supporting 4 TX and 4 RX channels for a total of 8 channels. Additionally, an SMA connector designated as “CLK IN/OUT” provides AC coupling with a nominal input impedance of 50 Ω. Digital data and control functions are facilitated through a VHDCI connector featuring 20 channels.

This PXI Express instrument adheres to a Gen 2×8 form factor and measures 18.3 cm × 13.0 cm × 2.0 cm (7.4 in. × 5.1 in. × 0.8 in.). It operates within a temperature range of 0 °C to 45 °C and a non-condensing relative humidity of 10% to 90%, while maintaining durability withstanding a peak operating shock of 30 g and random vibrations from 5 Hz to 500 Hz. With a weight of 414 g (14.0 oz), the PXIe-6591 is a robust solution for high-speed serial testing needs. Each unit is backed by a three-year warranty from National Instruments.