The National Instruments part number 785283-01 designates the PXIe-6570 PXI Digital Pattern Instrument, a high-performance solution tailored for semiconductor characterization and production testing applications. This instrument features 32 general channels, providing robust digital source and capture capabilities. Its intuitive digital pattern editor enables users to customize levels, timing, and patterns effectively. Designed with advanced debugging tools, the 785283-01 offers insights into pin states, system status, and includes a digital scope. The instrument supports a measurement range of -2 V to 7 V, making it suitable for diverse test and measurement systems.

The driver utilizes a single-ended signal type, and key parameters such as VIH, VTERM, and VIL are programmable within the -2 V to 6 V range. The maximum DC current is ±32 mA with an output impedance of 50 Ω, while the maximum input power is 68 W. The digital source can operate in serial and parallel modes, facilitating both broadcast and site-specific configurations. With a generous 32 MB of source memory and a capture memory size of 1 million samples accommodating up to 512 waveforms, the 785283-01 stands out for its extensive capabilities. The instrument occupies 2 PXIe slots, boasts a weight of 920 g (32.45 oz.), and has dimensions of 131 mm × 42 mm × 214 mm (5.16 in. × 1.65 in. × 8.43 in.). It is backed by a three-year warranty, ensuring reliability and performance from National Instruments.