Part Number: 778279-01

The National Instruments 778279-01 PXI Sound and Vibration Module, part of the PXI-4472 model series, is engineered for advanced sound and vibration measurements. This dynamic signal acquisition module features eight input channels that enable simultaneous digitization of signals. Each channel incorporates integrated electronic piezoelectric (IEPE) signal conditioning, facilitating direct connection to accelerometers and microphones without the need for external filters. The module's integrated anti-aliasing filters automatically adjust to the sampling rate, effectively mitigating the risk of aliasing. With both analog and real-time digital filters implemented in hardware, the 778279-01 ensures precise measurement by eliminating frequencies outside the analog-to-digital converters' range.

The module includes a 1,024-sample analog input FIFO buffer, which safeguards against data loss, and utilizes PCI mini-MITE technology for high-speed data transfer rates. It supports pretrigger and posttrigger modes for versatile signal capture, with trigger sources selectable from software commands, external digital inputs, PXI trigger buses, RTSI buses, or analog input channels. The external digital trigger is TTL/CMOS compatible, accommodating a broad array of triggering scenarios. For applications requiring high channel counts, multiple 778279-01 modules can be synchronized via the PXI star trigger bus, ensuring minimal phase mismatch and precise phase information across channels.

Boasting an input signal range of ±10 V and frequency precision of ±25 ppm, the 778279-01 excels in vibration and audio analysis applications. It integrates seamlessly with other National Instruments products, including NI LabVIEW, LabWindows/CVI, and Measurement Studio, utilizing NI-DAQmx for hardware and operating system interfacing. When paired with the NI Sound and Vibration Toolkit or the NI Sound and Vibration Measurement Suite, it enables comprehensive analyses such as power spectra, frequency responses, sound-level measurements, and order extraction.