The National Instruments 781217-01 PXI RF Analog Signal Generator, identified by the model number PXIe-5652, is a versatile and high-performance instrument tailored for a wide array of RF testing and signal generation applications. Covering a frequency range from 500 kHz to 6.6 GHz, this signal generator is adept at fulfilling both low and high-frequency requirements. It boasts exceptional spectral purity, achieving single sideband phase noise measurements of less than -111 dBc/Hz at 100 MHz and -84 dBc/Hz at 6.6 GHz. The 781217-01 is engineered to generate continuous waves and supports various modulation types, including two-level frequency-shift keying (2-FSK), on-off keying (OOK), and frequency modulation (FM).

Utilizing direct digital synthesis (DDS), the generator facilitates high-resolution frequency hopping and phase-continuous sweeping, making it ideal for applications such as characterizing fixtures and devices in WCDMA communications environments. The device allows for both digital and analog modulation, including sine, triangle, and square waveforms, though it does not support external modulation sources. Its frequency resolution varies based on the frequency range: less than 3 Hz up to 1.3 GHz, less than 6 Hz from 1.3 GHz to 3.3 GHz, and less than 12 Hz from 3.3 GHz to 6.6 GHz.

The internal clock offers an initial precision of ±3 ppm, providing reliable frequency generation stability of ±1 ppm across temperatures from 15 ºC to 35 ºC, with an aging rate of ±5 ppm per year. The generator also excels in jitter performance, achieving measurements below 200 fs RMS at 622 MHz and under 50 fs RMS at 2.488 GHz, with corresponding jitter bandwidths. This combination of features positions the 781217-01 as a powerful solution for various applications, including bit error rate testing, antenna testing, and keyless entry systems.