The National Instruments 783762-01, also known as the PXIe-4135, is a high-performance PXI Source Measure Unit (SMU) designed for precision measurement and sourcing applications. Capable of 4-quadrant operation, this versatile unit provides a maximum DC source power of 20 W and a maximum DC sink power of 12 W, along with a pulsed current capability ranging from -3 A to 3 A. It features advanced analog-to-digital conversion technology, ensuring high-resolution measurements with a current resolution of 10 fA and supports high-speed data acquisition rates of up to 1.8 MS/s. The PXIe-4135 is equipped with SourceAdapt technology, optimizing measurement stability and accuracy by adapting the transient response to match the load characteristics.

This module is ideal for various applications, including manufacturing tests, board-level evaluations, and laboratory characterizations, handling a diverse array of devices such as integrated circuits (ICs), power management ICs (PMICs), RF ICs, LEDs, and optical transceivers. The interactive soft front panels facilitate basic measurements and are useful for debugging automated applications, while the included driver features comprehensive help files, documentation, and ready-to-run example projects to streamline test code development. Moreover, the programming interface is compatible with multiple development environments, enhancing user flexibility.

Engineered for scalability, the 783762-01 SMU allows the construction of parallel high-channel-count systems, supporting up to 68 SMU channels in a single PXIe chassis, with potential expansion to several hundred channels. Users can maximize test throughput through a high-speed communication bus, deterministic hardware sequencing, and digital control loop technology, enabling custom optimization of the SMU response tailored to the device under test. Software-controlled SMU response eliminates the delays associated with settling times, offering adjustments to mitigate overshoot and oscillations, thus ensuring precise control over testing conditions.