The National Instruments 785809-01 Multifunction I/O Device, also known as PCle-6376, is an advanced data acquisition (DAQ) solution tailored for high-performance applications including IF digitization, transient recording, telecom testing, ultrasound, sonar testing, and high-energy physics experiments. This device features eight differential analog input channels with a 16-bit ADC resolution, capable of achieving a maximum sample rate of 3.571 MS/s, and offers a timing resolution of 10 ns with DC input coupling. The input ranges include ±1V, ±2V, ±5V, and ±10V, boasting a bandwidth of 1 MHz, and an impressive input impedance of over 100 GΩ in parallel with 100 pF, ensuring minimal interference and high measurement precision.

For analog output, the 785809-01 is equipped with two channels featuring a 16-bit DAC resolution and a maximum update rate of 3.3 MS/s. Output ranges are available at ±10V, ±5V, or configurable using an external reference on APFI 0, supplemented by an output impedance of 0.4 Ω and a slew rate of 20 V/µs. With capabilities for periodic waveform regeneration and a settling time of just 2 µs for full-scale steps, the output section is ideal for dynamic signal generation.

The device's digital I/O section comprises 24 configurable channels, each capable of being individually set as input or output. Enhanced protection features include ±20V input protection for up to two pins, along with support for DMA (scatter-gather) data transfers, debounce filtering, and high current drive capabilities to accommodate complex digital interfacing applications. Operating temperatures range from 0 °C to 50 °C, and it can be safely stored between -20 °C to 70 °C. With a compact 4 x PCI Express form factor, the device seamlessly integrates into a variety of systems, compatible with x4, x8, and x16 slots, making it a versatile choice for high-demand environments.

The 785809-01 measures 16.8 cm x 11.1 cm (6.60 in. x 4.38 in.) and weighs 120 g (4.1 oz.), and it is backed by a warranty period of 2-3 years.