The National Instruments SET-3000 Semiconductor Test System is an advanced hardware platform specifically engineered for semiconductor testing applications, offering precise fault insertion and signal simulation capabilities. Tailored for integration within Hardware-in-the-Loop (HiL) test environments, the SET-3000 enables users to replicate critical fault conditions such as open circuits and short circuits, making it indispensable in high-stakes sectors such as automotive and aerospace, where rigorous testing protocols are essential to ensure the safety and reliability of electronic components. Built on a modular PXI platform, the SET-3000 provides exceptional scalability and flexibility, allowing for seamless upgrades to accommodate evolving test requirements. Its high-density fault insertion modules empower engineers to simulate intricate fault scenarios while maintaining signal integrity. Designed to optimize production test applications, the SET-3000 is capable of rapid, repeatable testing, enabling manufacturers to swiftly identify and rectify potential device failures during the production cycle. Integration with widely-used software such as LabVIEW and TestStand enhances its utility in automated test systems. Additionally, the SET-3000 features programmable fault conditions to thoroughly evaluate both digital and analog signal performance under diverse scenarios, positioning it as a vital tool for device performance analysis. Its remarkable real-time data acquisition and high-speed signal processing capabilities make the SET-3000 a dependable solution for semiconductor production lines, where minimal downtime and consistent performance are paramount. The compact, energy-efficient design further amplifies its suitability for laboratory and manufacturing environments with strict space and power constraints.

The SET-3000 operates within a temperature range of 0°C to 40°C with forced-air cooling and can withstand storage temperatures from -40°C to 85°C. It supports relative humidity levels of 10%-90% during operation and 5%-95% during storage, ensuring reliable performance even in challenging conditions. With a maximum operating altitude of 2000 meters above sea level, the SET-3000 is prepared for diverse testing environments. This system's advanced fault simulation capabilities include open and short circuits, as well as pin-to-pin shorts, further enhancing its application in the semiconductor field.